PDF Data Sheets

On the button
(322 KB)

Managing the information
(630 KB)

EEPROM write cycles 100,000 max.

EEPROM data retention: 100 years @ 25 deg C

Weight: <1g

Baud rate: 57.6k Bits/sec

Maximum ratings

Operating temperature range
(read/write):
-55 deg C to +125 deg C

Storage temperature range:
-60 deg C to +150 deg C

Stresses above maximum ratings may cause permanent damage. Exposure to maximum rating conditions for extended periods may affect reliability.

Style 1

Style 2

Change of temperature:
IEC 68-2-14 BS2011 Test Na
Ta = -55 degC, Tb = +125 degC, T1 =30 mins

Damp heat:
MIL-STD-810E Method 507.3
Procedure III Agravated test

Bump:
IEC 68-2-9 BS2011 Test Eb
4000 bumps +/- 10 bumps
400m/S2 (40g)

Mechanical shock:
IEC 68-6-27 BS2011 Test Ea
1000m/S2 (100g), 6mSec
Half sinewave pulse

Vibration:
IEC 68-2-6 BS2011 Test Fc
10-2000Hz 200m/S2 (20g)

Low air pressure:
IEC 68-2-13 BS2011 Test M
40mBar, 30 minutes

Sealing:
IEC 68-2-17 BS EN 60068-2-17
Test Qc
Method 2, t = 20 min liquid temp 125 degC

Salt mist:
IEC 68-2-52 Test Kb severity 3

Solvent resistance:
IEC69-2-45 BSEN60069-2-45 Test Xa

EMC: Def- Stan 59-41

ESD: MIL-STD-883E